Photoemission microscopy for surface states of copper measured at different photoelectron energies

T. Sugiyama, M. Aida, N. Ueno, T. Munakata

研究成果: Contribution to journalArticle査読

2 被引用数 (Scopus)

抄録

We have applied microspot photoemission spectroscopy to the surface imaging of a polycrystalline Cu plate with a lateral resolution of 0.3 μm and an energy resolution of 30 meV. The images of the crystalline islands with the (1 1 1) surface were measured by detecting photoelectrons due to the Shockley surface state (SS) and the sp-band specific to the (1 1 1) surface. The dependence of the images on the photoelectron energies was related to the mean length of the (1 1 1) terrace. The (1 1 1) island measured with the photoelectron close to the work function cutoff was found to be shifted from that measured with the Shockley state. The result demonstrates that the very high-energy resolution is essential for precise understanding of the surface images.

本文言語英語
ページ(範囲)1167-1169
ページ数3
ジャーナルJournal of Electron Spectroscopy and Related Phenomena
144-147
DOI
出版ステータス出版済み - 6 2005
外部発表はい

All Science Journal Classification (ASJC) codes

  • 電子材料、光学材料、および磁性材料
  • 放射線
  • 原子分子物理学および光学
  • 凝縮系物理学
  • 分光学
  • 物理化学および理論化学

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