TY - GEN
T1 - Plasma CVD for producing Si quantum dot films
AU - Iwashita, Shinya
AU - Miyahara, Hiroomi
AU - Koga, Kazunori
AU - Shiratani, Masaharu
AU - Nunomura, Shota
AU - Kondo, Michio
PY - 2006/12/1
Y1 - 2006/12/1
N2 - Si quantum dot films are deposited using a multi-hollow discharge plasma CVD method. For the method, Si nano-crystallites of a small size dispersion and radicals are produced using H2+SiH4 VHF discharges, and then they are co-deposited on to a substrate to form Si quantum dot films, that is, a-Si:H films containing nano-crystallites. The films have a wide optical band gap of 1.8 eV and a large optical absorption coefficient similar to those of a-Si:H films. They also have a low initial defect density below 1×1016 cm-3 and show high stability against light soaking. These results suggest that the Si quantum dot films are promising materials for solar cells.
AB - Si quantum dot films are deposited using a multi-hollow discharge plasma CVD method. For the method, Si nano-crystallites of a small size dispersion and radicals are produced using H2+SiH4 VHF discharges, and then they are co-deposited on to a substrate to form Si quantum dot films, that is, a-Si:H films containing nano-crystallites. The films have a wide optical band gap of 1.8 eV and a large optical absorption coefficient similar to those of a-Si:H films. They also have a low initial defect density below 1×1016 cm-3 and show high stability against light soaking. These results suggest that the Si quantum dot films are promising materials for solar cells.
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U2 - 10.1109/DEIV.2006.357362
DO - 10.1109/DEIV.2006.357362
M3 - Conference contribution
AN - SCOPUS:47349120550
SN - 1424401925
SN - 9781424401925
T3 - Proceedings - International Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV
SP - 558
EP - 560
BT - Proceedings of the 22nd International Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV
T2 - 22nd International Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV
Y2 - 25 September 2006 through 29 September 2006
ER -