Plastically deformed Ge-crystal wafers as elements for neutron focusing monochromator

H. Hiraka, K. Ohkubo, M. Furusaka, Y. Kiyanagi, K. Yamada, K. Morishita, K. Nakajima

研究成果: ジャーナルへの寄稿学術誌査読

1 被引用数 (Scopus)

抄録

Plastically deformed Ge-crystal wafers that have the cylindrical shape with a large curvature were characterized by neutron diffraction. The box-type rocking curve of Bragg reflection with the angular width of Γ box ≃ 2° in FWHM, which is observable in the monochromatic neutron diffraction, results in an enhancement in the angle-integrated intensity (Iθ). Besides, Iθ efficiently increases by stacking such Ge wafers. In the course of white neutron diffraction, the reflected-beam width near the focus point becomes sharper than the initial beam width. Further, the dependence of the horizontal beam width on the distance between the sample and detector is quantitatively explained by taking account of the large Γbox, the small mosaic spread of η ≃ 0:1°, and the thickness of the wafers. On the basis of these characterizations, use of plastically deformed Ge wafers as elements for high-luminance neutron monochromator is proposed.

本文言語英語
ページ(範囲)166-169
ページ数4
ジャーナルNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
693
DOI
出版ステータス出版済み - 11月 21 2012
外部発表はい

!!!All Science Journal Classification (ASJC) codes

  • 核物理学および高エネルギー物理学
  • 器械工学

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