TY - JOUR
T1 - Plastically deformed Ge-crystal wafers as elements for neutron focusing monochromator
AU - Hiraka, H.
AU - Ohkubo, K.
AU - Furusaka, M.
AU - Kiyanagi, Y.
AU - Yamada, K.
AU - Morishita, K.
AU - Nakajima, K.
N1 - Funding Information:
We thank M. Ohkawara and K. Nemoto for their assistance in the neutron-scattering experiments at JRR-3. This study was carried out under the Common-Use Facility Program of IMR of Tohoku University, ISSP of Tokyo University, and JRR-3 of Japan Atomic Energy Agency. We also appreciate the supportive fund from the Quantum Beam Technology Program of JST and the Cooperation Program with Universities of KEK . The study performed at Tohoku University was supported by the Grant-in-Aid for Science Research B ( 22340089 ) and A ( 22244039 ) from the MEXT of Japan .
PY - 2012/11/21
Y1 - 2012/11/21
N2 - Plastically deformed Ge-crystal wafers that have the cylindrical shape with a large curvature were characterized by neutron diffraction. The box-type rocking curve of Bragg reflection with the angular width of Γ box ≃ 2° in FWHM, which is observable in the monochromatic neutron diffraction, results in an enhancement in the angle-integrated intensity (Iθ). Besides, Iθ efficiently increases by stacking such Ge wafers. In the course of white neutron diffraction, the reflected-beam width near the focus point becomes sharper than the initial beam width. Further, the dependence of the horizontal beam width on the distance between the sample and detector is quantitatively explained by taking account of the large Γbox, the small mosaic spread of η ≃ 0:1°, and the thickness of the wafers. On the basis of these characterizations, use of plastically deformed Ge wafers as elements for high-luminance neutron monochromator is proposed.
AB - Plastically deformed Ge-crystal wafers that have the cylindrical shape with a large curvature were characterized by neutron diffraction. The box-type rocking curve of Bragg reflection with the angular width of Γ box ≃ 2° in FWHM, which is observable in the monochromatic neutron diffraction, results in an enhancement in the angle-integrated intensity (Iθ). Besides, Iθ efficiently increases by stacking such Ge wafers. In the course of white neutron diffraction, the reflected-beam width near the focus point becomes sharper than the initial beam width. Further, the dependence of the horizontal beam width on the distance between the sample and detector is quantitatively explained by taking account of the large Γbox, the small mosaic spread of η ≃ 0:1°, and the thickness of the wafers. On the basis of these characterizations, use of plastically deformed Ge wafers as elements for high-luminance neutron monochromator is proposed.
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U2 - 10.1016/j.nima.2012.07.011
DO - 10.1016/j.nima.2012.07.011
M3 - Article
AN - SCOPUS:84897521748
VL - 693
SP - 166
EP - 169
JO - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
JF - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
SN - 0168-9002
ER -