Point defect clusters and dislocations in FIB irradiated nanocrystalline aluminum films: An electron tomography and aberration-corrected high-resolution ADF-STEM study
Hosni Idrissi, Stuart Turner, Masatoshi Mitsuhara, Binjie Wang, Satoshi Hata, Michael Coulombier, Jean Pierre Raskin, Thomas Pardoen, Gustaaf Van Tendeloo, Dominique Schryvers
研究成果: ジャーナルへの寄稿 › 学術誌 › 査読
31
被引用数
(Scopus)