Polarity determination of wurtzite-type crystals using hard x-ray photoelectron diffraction

Jesse R. Williams, Masaaki Kobata, Igor Pis, Eiji Ikenaga, Takeharu Sugiyama, Keisuke Kobayashi, Naoki Ohashi

研究成果: ジャーナルへの寄稿学術誌査読

19 被引用数 (Scopus)

抄録

The surface structure of a single-crystal ZnO wafer was studied by angle-resolved x-ray photoelectron spectroscopy (ARXPS) using synchrotron radiation. As a result, well-defined x-ray photoelectron diffraction (XPD) patterns were obtained for the (0001) and (0001̄) polar surfaces using the photoemission from the Zn 2p3/2 and O 1s core levels. The XPD patterns were indexed assuming forward scattering of photoelectrons by neighboring ions. Further, the XPD patterns for the (0001) and (0001̄) surfaces were different from each other, indicating the possibility for using the XPD technique for polarity determination.

本文言語英語
ページ(範囲)1336-1340
ページ数5
ジャーナルSurface Science
605
13-14
DOI
出版ステータス出版済み - 7月 2011
外部発表はい

!!!All Science Journal Classification (ASJC) codes

  • 凝縮系物理学
  • 表面および界面
  • 表面、皮膜および薄膜
  • 材料化学

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