抄録
Yttria stabilized zirconia (YSZ) films with the thickness of up to 12 μm were prepared on alumina and NiO-YSZ substrates by electron beam physical vapor deposition (EB-PVD). The films showed nano-scaled columnar structures depending on the substrate temperature. Electrical conductivity of the YSZ films on alumina was also investigated at the temperature between 700 and 1000°C in oxidizing atmosphere. High activation energy of the conductivity (>1.03eV) indicated that the conduction via grain boundary controlled the ionic conduction in the films prepared by EB-PVD. La0.6Sr0.4CoO 3-δ as a cathode was applied on the YSZ/NiO-YSZ in order to evaluate the performance of the YSZ electrolyte.
本文言語 | 英語 |
---|---|
ページ(範囲) | 913-916 |
ページ数 | 4 |
ジャーナル | Key Engineering Materials |
巻 | 317-318 |
出版ステータス | 出版済み - 1月 1 2006 |
外部発表 | はい |
!!!All Science Journal Classification (ASJC) codes
- 材料科学(全般)
- 材料力学
- 機械工学