Information about breakdown time lags under pulsed voltage stress is prerequisite to the insulation design of superconducting devices. Experiments have been carried out using a pulse generator which provides a step voltage with 200 ns rise time and a long decay time constant of more than 1 ms. The present experiments may bridge the information gap between time lag measurements in the ns range using extremely high field strengths, and existing data found with usual lightning impulse voltage. The test device is described in the paper, and some typical results are discussed in detail.
|ジャーナル||IEEE Transactions on Dielectrics and Electrical Insulation|
|出版ステータス||出版済み - 6月 1994|
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