Quantification by aberration corrected (S)TEM of boundaries formed by symmetry breaking phase transformations

D. Schryvers, E. K.H. Salje, Minoru Nishida, A. De Backer, H. Idrissi, S. Van Aert

研究成果: ジャーナルへの寄稿記事

抄録

The present contribution gives a review of recent quantification work of atom displacements, atom site occupations and level of crystallinity in various systems and based on aberration corrected HR(S)TEM images. Depending on the case studied, picometer range precisions for individual distances can be obtained, boundary widths at the unit cell level determined or statistical evolutions of fractions of the ordered areas calculated. In all of these cases, these quantitative measures imply new routes for the applications of the respective materials.

元の言語英語
ページ(範囲)194-199
ページ数6
ジャーナルUltramicroscopy
176
DOI
出版物ステータス出版済み - 5 1 2017

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Aberrations
phase transformations
aberration
broken symmetry
Phase transitions
Transmission electron microscopy
Atoms
transmission electron microscopy
occupation
atoms
crystallinity
routes
cells

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

これを引用

Quantification by aberration corrected (S)TEM of boundaries formed by symmetry breaking phase transformations. / Schryvers, D.; Salje, E. K.H.; Nishida, Minoru; De Backer, A.; Idrissi, H.; Van Aert, S.

:: Ultramicroscopy, 巻 176, 01.05.2017, p. 194-199.

研究成果: ジャーナルへの寄稿記事

Schryvers, D. ; Salje, E. K.H. ; Nishida, Minoru ; De Backer, A. ; Idrissi, H. ; Van Aert, S. / Quantification by aberration corrected (S)TEM of boundaries formed by symmetry breaking phase transformations. :: Ultramicroscopy. 2017 ; 巻 176. pp. 194-199.
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