Quantification by aberration corrected (S)TEM of boundaries formed by symmetry breaking phase transformations

D. Schryvers; E. K.H. Salje; M. Nishida; A. De Backer; H. Idrissi; S. Van Aert

doi:10.1016/j.ultramic.2016.12.022

Quantification by aberration corrected (S)TEM of boundaries formed by symmetry breaking phase transformations

D. Schryvers, E. K.H. Salje, M. Nishida, A. De Backer, H. Idrissi, S. Van Aert

固体材料物性工学

研究成果: ジャーナルへの寄稿 › 学術誌 › 査読

2 被引用数 (Scopus)

抄録

The present contribution gives a review of recent quantification work of atom displacements, atom site occupations and level of crystallinity in various systems and based on aberration corrected HR(S)TEM images. Depending on the case studied, picometer range precisions for individual distances can be obtained, boundary widths at the unit cell level determined or statistical evolutions of fractions of the ordered areas calculated. In all of these cases, these quantitative measures imply new routes for the applications of the respective materials.

本文言語	英語
ページ（範囲）	194-199
ページ数	6
ジャーナル	Ultramicroscopy
巻	176
DOI	https://doi.org/10.1016/j.ultramic.2016.12.022
出版ステータス	出版済み - 5月 1 2017

!!!All Science Journal Classification (ASJC) codes

電子材料、光学材料、および磁性材料
原子分子物理学および光学
器械工学

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10.1016/j.ultramic.2016.12.022

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author = "D. Schryvers and Salje, {E. K.H.} and M. Nishida and {De Backer}, A. and H. Idrissi and {Van Aert}, S.",

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AU - Schryvers, D.

AU - Salje, E. K.H.

AU - Nishida, M.

AU - De Backer, A.

AU - Idrissi, H.

AU - Van Aert, S.

PY - 2017/5/1

Y1 - 2017/5/1

N2 - The present contribution gives a review of recent quantification work of atom displacements, atom site occupations and level of crystallinity in various systems and based on aberration corrected HR(S)TEM images. Depending on the case studied, picometer range precisions for individual distances can be obtained, boundary widths at the unit cell level determined or statistical evolutions of fractions of the ordered areas calculated. In all of these cases, these quantitative measures imply new routes for the applications of the respective materials.

AB - The present contribution gives a review of recent quantification work of atom displacements, atom site occupations and level of crystallinity in various systems and based on aberration corrected HR(S)TEM images. Depending on the case studied, picometer range precisions for individual distances can be obtained, boundary widths at the unit cell level determined or statistical evolutions of fractions of the ordered areas calculated. In all of these cases, these quantitative measures imply new routes for the applications of the respective materials.

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AN - SCOPUS:85011263112

SN - 0304-3991

VL - 176

SP - 194

EP - 199

JO - Ultramicroscopy

JF - Ultramicroscopy

ER -

Quantification by aberration corrected (S)TEM of boundaries formed by symmetry breaking phase transformations

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!!!All Science Journal Classification (ASJC) codes

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