Quantification of temperature rise in unipolar organic conductors during short voltage-pulse excitation using electrical testing methods

研究成果: Contribution to journalArticle査読

11 被引用数 (Scopus)

抄録

To quantify the rise in device temperature caused by Joule heating during short voltage-pulse excitation at high current densities (>10 A/cm2), the device temperatures of unipolar organic conductors were measured using electrical testing methods. For a maximum voltage amplitude of 59 V at a current density of ∼300 A/cm2, temperature rose over 145°C within a pulse duration of 5 μs in an N,N'-di(1-naphthyl)-N,N'-diphenylbenzidine (α-NPD)-based single-carrier organic conductor. This result is in reasonable agreement with numerically calculated values. These findings indicate that suppressing the effects of Joule heating by carefully adjusting pulse width, substrate and organic materials, and device configuration is important to achieve further carrier injection in the ultra-high current density region (>1 kA/cm2).

本文言語英語
ページ(範囲)191-197
ページ数7
ジャーナルOrganic Electronics
31
DOI
出版ステータス出版済み - 4 1 2016

All Science Journal Classification (ASJC) codes

  • 電子材料、光学材料、および磁性材料
  • 生体材料
  • 化学 (全般)
  • 凝縮系物理学
  • 材料化学
  • 電子工学および電気工学

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