Quantitative analysis between visual mismatch negativity and psychopathology scale for schizophrenia

Kazuhiko Goto, Takenao Sugi, Toshihiko Maekawa, Katuya Ogata, Yoshinobu Goto, Shozo Tobitnatsu, Masatoshi Nakatnura

研究成果: Chapter in Book/Report/Conference proceedingConference contribution

抄録

Visual mismatch negativity (v-MMN) in electroencephalographic (EEG) record provides an index of preattentive information processing of the brain. v-MMN is considered to reflect schizophrenia. The positive and negative syndrome scale (PANSS) is usually used in clinical diagnosis on patients with schizophrenia for estimating the degree of disorder. Tn this study, the relationship between v-MMN and PANSS was analyzed. Characteristic parameters of peaks including Nl, N2, P300, and MMN were established respectively. Estimated function was constructed by selected parameters. P300 was most significant characteristic related to all items of PANSS.

本文言語英語
ホスト出版物のタイトルICCAS-SICE 2009 - ICROS-SICE International Joint Conference 2009, Proceedings
ページ853-856
ページ数4
出版ステータス出版済み - 2009
イベントICROS-SICE International Joint Conference 2009, ICCAS-SICE 2009 - Fukuoka, 日本
継続期間: 8 18 20098 21 2009

出版物シリーズ

名前ICCAS-SICE 2009 - ICROS-SICE International Joint Conference 2009, Proceedings

その他

その他ICROS-SICE International Joint Conference 2009, ICCAS-SICE 2009
Country日本
CityFukuoka
Period8/18/098/21/09

All Science Journal Classification (ASJC) codes

  • Information Systems
  • Control and Systems Engineering
  • Industrial and Manufacturing Engineering

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