Quantitative Discussion on Sensitivity to Terahertz Waves of Detectors Made of MOSFET and High-Electron Mobility Transistor

Hiromu Kojima, Haruichi Kanaya, Tanemasa Asano

研究成果: 著書/レポートタイプへの貢献会議での発言

抜粋

A newly developed circuit model is presented to describe detection characteristic of square law detectors made of an FET under non-quasistatic condition. Sensing performance calculated using formulae derived from the model agrees well with results of experiment carried out to detect 1.0 THz waves using InAs-channel high-electron mobility transistor (HEMT). The model predicts that HEMT offers much higher voltage sensitivity to terahertz waves than Si MOSFET even for miniaturized devices.

元の言語英語
ホスト出版物のタイトルProceedings of the International Japan-Africa Conference on Electronics, Communications and Computations, JAC-ECC 2019
出版者Institute of Electrical and Electronics Engineers Inc.
ページ128-131
ページ数4
ISBN(電子版)9781728156170
DOI
出版物ステータス出版済み - 12 2019
イベント7th International Japan-Africa Conference on Electronics, Communications and Computations, JAC-ECC 2019 - Alexandria, エジプト
継続期間: 12 15 201912 16 2019

出版物シリーズ

名前Proceedings of the International Japan-Africa Conference on Electronics, Communications and Computations, JAC-ECC 2019

会議

会議7th International Japan-Africa Conference on Electronics, Communications and Computations, JAC-ECC 2019
エジプト
Alexandria
期間12/15/1912/16/19

All Science Journal Classification (ASJC) codes

  • Computer Networks and Communications
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Control and Optimization
  • Artificial Intelligence

フィンガープリント Quantitative Discussion on Sensitivity to Terahertz Waves of Detectors Made of MOSFET and High-Electron Mobility Transistor' の研究トピックを掘り下げます。これらはともに一意のフィンガープリントを構成します。

  • これを引用

    Kojima, H., Kanaya, H., & Asano, T. (2019). Quantitative Discussion on Sensitivity to Terahertz Waves of Detectors Made of MOSFET and High-Electron Mobility Transistor. : Proceedings of the International Japan-Africa Conference on Electronics, Communications and Computations, JAC-ECC 2019 (pp. 128-131). [9051237] (Proceedings of the International Japan-Africa Conference on Electronics, Communications and Computations, JAC-ECC 2019). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/JAC-ECC48896.2019.9051237