TY - JOUR
T1 - Radiation hardness study for the COMET Phase-I electronics
AU - Nakazawa, Yu
AU - Fujii, Yuki
AU - Gillies, Ewen
AU - Hamada, Eitaro
AU - Igarashi, Youichi
AU - Lee, Myeong Jae
AU - Moritsu, Manabu
AU - Matsuda, Yugo
AU - Miyazaki, Yuta
AU - Nakai, Yuki
AU - Natori, Hiroaki
AU - Oishi, Kou
AU - Sato, Akira
AU - Uchida, Yoshi
AU - Ueno, Kazuki
AU - Yamaguchi, Hiroshi
AU - Yeo, Beom Ki
AU - Yoshida, Hisataka
AU - Zhang, Jie
N1 - Funding Information:
The authors are grateful to Prof. Y. Furuyama, Dr. A. Taniike, Mr. T. Yokose and Mr. H. Kageyama (Kobe University) for the operation of the tandem electrostatic accelerator; Prof. K. Sagara, Prof. T. Kin, Prof. S. Sakaguchi and Dr. S. Araki (Kyushu University) for the operation of the tandem electrostatic accelerator; Dr. A. Idesaki (QST) for gamma-ray exposure in National Institute for Quantum and Radiological Science and Technology; Mr. I. Yoda (Tokyo Institute of Technology) for gamma-ray exposure in Radioisotope Research Center; Dr. S. Tojo and Mr. Y. Okada (Osaka University) for gamma-ray exposure in ISIR. This work was supported by JSPS, Japan KAKENHI Grant Numbers JP17H04841 , JP25000004 , JP18H03704 and JP18H05231 ; Institute for Basic Science (IBS) of Republic of Korea under Project No. IBS-R017- D1-2018-a00 ; National Natural Science Foundation of China (NSFC) under Contracts No. 11335009 .
Funding Information:
The authors are grateful to Prof. Y. Furuyama, Dr. A. Taniike, Mr. T. Yokose and Mr. H. Kageyama (Kobe University) for the operation of the tandem electrostatic accelerator; Prof. K. Sagara, Prof. T. Kin, Prof. S. Sakaguchi and Dr. S. Araki (Kyushu University) for the operation of the tandem electrostatic accelerator; Dr. A. Idesaki (QST) for gamma-ray exposure in National Institute for Quantum and Radiological Science and Technology; Mr. I. Yoda (Tokyo Institute of Technology) for gamma-ray exposure in Radioisotope Research Center; Dr. S. Tojo and Mr. Y. Okada (Osaka University) for gamma-ray exposure in ISIR. This work was supported by JSPS, Japan KAKENHI Grant Numbers JP17H04841, JP25000004, JP18H03704 and JP18H05231; Institute for Basic Science (IBS) of Republic of Korea under Project No. IBS-R017- D1-2018-a00; National Natural Science Foundation of China (NSFC) under Contracts No. 11335009.
Publisher Copyright:
© 2019 Elsevier B.V.
PY - 2020/3/1
Y1 - 2020/3/1
N2 - Radiation damage on front-end readout and trigger electronics is an important issue in the COMET Phase-I experiment at J-PARC, which plans to search for the neutrinoless transition of a muon to an electron. To produce an intense muon beam, a high-power proton beam impinges on a graphite target, resulting in a high-radiation environment. We require radiation tolerance to a total dose of 1.0kGy and 1MeV equivalent neutron fluence of 1.0×1012neqcm−2 including a safety factor of 5 over the duration of the physics measurement. The use of commercially-available electronics components which have high radiation tolerance, if such components can be secured, is desirable in such an environment. The radiation hardness of commercial electronic components has been evaluated in gamma-ray and neutron irradiation tests. As results of these tests, voltage regulators, ADCs, DACs, and several other components were found to have enough tolerance to both gamma-ray and neutron irradiation at the level we require.
AB - Radiation damage on front-end readout and trigger electronics is an important issue in the COMET Phase-I experiment at J-PARC, which plans to search for the neutrinoless transition of a muon to an electron. To produce an intense muon beam, a high-power proton beam impinges on a graphite target, resulting in a high-radiation environment. We require radiation tolerance to a total dose of 1.0kGy and 1MeV equivalent neutron fluence of 1.0×1012neqcm−2 including a safety factor of 5 over the duration of the physics measurement. The use of commercially-available electronics components which have high radiation tolerance, if such components can be secured, is desirable in such an environment. The radiation hardness of commercial electronic components has been evaluated in gamma-ray and neutron irradiation tests. As results of these tests, voltage regulators, ADCs, DACs, and several other components were found to have enough tolerance to both gamma-ray and neutron irradiation at the level we require.
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U2 - 10.1016/j.nima.2019.163247
DO - 10.1016/j.nima.2019.163247
M3 - Article
AN - SCOPUS:85076717198
SN - 0168-9002
VL - 955
JO - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
JF - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
M1 - 163247
ER -