Raman spectroscopic fingerprint of ferroelectric SrBi2Ta2O9 thin films: A rapid distinction method for fluorite and pyrochlore phases

Minoru Osada, Masato Kakihana, Masatoshi Mitsuya, Takayuki Watanabe, Hiroshi Funakubo

研究成果: ジャーナルへの寄稿記事

12 引用 (Scopus)

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We present the use of Raman spectroscopy as a rapid and sensitive means for the phase characterization of ferroelectric SrBi2(Ta1-xNbx)2O9 (SBTN) thin films. It is shown that frequency shifts, together with Raman selection rules, are characteristic of layered perovskite, fluorite and pyrochlore structures, and thus the Raman spectra can be used as a fingerprint of the symmetry of the examined film. We also find the enormous potential of Raman spectroscopy to detect and quantify fractions of the fluorite and pyrochlore phases coexistent with the SBTN phase.

元の言語英語
ページ(範囲)L891-L893
ジャーナルJapanese Journal of Applied Physics, Part 2: Letters
40
発行部数8 B
出版物ステータス出版済み - 8 15 2001
外部発表Yes

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All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Physics and Astronomy (miscellaneous)
  • Physics and Astronomy(all)

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