抄録
Measuring the cross-track profiles of a microtrack created by DC erasing both sides of a recorded track, the linear recording density dependence of the written track fringe width and that of the read track fringe width were successfully separated, both of which are usually observed in combination. It was clarified that when a thin-film head is used for reading, the read track fringe width increases as the linear recording density decreases, whereas it remains almost constant when an MR head with wide shielding layers is used. It was also clarified that the record head fringe width for a thin-film inductive head is less dependent on the linear recording density. The effects of several heads with different pole shapes on track edge phenomena were also evaluated, by partially DC erasing a written track from the track edge and measuring the change in the residual track output. It was found that the fringe field width of a record head changes depending on the pole shape, and the trimming of record head poles is very effective in reducing head field fringe effects.
| 元の言語 | 英語 |
|---|---|
| ページ（範囲） | 2165-2170 |
| ページ数 | 6 |
| ジャーナル | IEICE Transactions on Electronics |
| 巻 | E82-C |
| 発行部数 | 12 |
| 出版物ステータス | 出版済み - 1 1 1999 |
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All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering
これを引用
Read/write track fringe effect of thin film and mr heads with different pole shapes. / Tanaka, Terumitsu; Wakamiya, Kohei; Suzuki, Toshiyuki.
：: IEICE Transactions on Electronics, 巻 E82-C, 番号 12, 01.01.1999, p. 2165-2170.研究成果: ジャーナルへの寄稿 › 記事
}
TY - JOUR
T1 - Read/write track fringe effect of thin film and mr heads with different pole shapes
AU - Tanaka, Terumitsu
AU - Wakamiya, Kohei
AU - Suzuki, Toshiyuki
PY - 1999/1/1
Y1 - 1999/1/1
N2 - Measuring the cross-track profiles of a microtrack created by DC erasing both sides of a recorded track, the linear recording density dependence of the written track fringe width and that of the read track fringe width were successfully separated, both of which are usually observed in combination. It was clarified that when a thin-film head is used for reading, the read track fringe width increases as the linear recording density decreases, whereas it remains almost constant when an MR head with wide shielding layers is used. It was also clarified that the record head fringe width for a thin-film inductive head is less dependent on the linear recording density. The effects of several heads with different pole shapes on track edge phenomena were also evaluated, by partially DC erasing a written track from the track edge and measuring the change in the residual track output. It was found that the fringe field width of a record head changes depending on the pole shape, and the trimming of record head poles is very effective in reducing head field fringe effects.
AB - Measuring the cross-track profiles of a microtrack created by DC erasing both sides of a recorded track, the linear recording density dependence of the written track fringe width and that of the read track fringe width were successfully separated, both of which are usually observed in combination. It was clarified that when a thin-film head is used for reading, the read track fringe width increases as the linear recording density decreases, whereas it remains almost constant when an MR head with wide shielding layers is used. It was also clarified that the record head fringe width for a thin-film inductive head is less dependent on the linear recording density. The effects of several heads with different pole shapes on track edge phenomena were also evaluated, by partially DC erasing a written track from the track edge and measuring the change in the residual track output. It was found that the fringe field width of a record head changes depending on the pole shape, and the trimming of record head poles is very effective in reducing head field fringe effects.
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M3 - Article
AN - SCOPUS:0033318390
VL - E82-C
SP - 2165
EP - 2170
JO - IEICE Transactions on Electronics
JF - IEICE Transactions on Electronics
SN - 0916-8524
IS - 12
ER -