Recent development in quantitative electron diffraction for crystallography of materials

Yoshitsugu Tomokiyo, Syo Matsumura

研究成果: Contribution to journalReview article査読

4 被引用数 (Scopus)

抄録

The present paper gives an extended review on applications of electron diffraction techniques to practical problems in materials science, such as (1) determination of structure factors and temperature factors by the critical voltage and intersecting Kikuchi line (IKL) methods, (2) measurement of local lattice parameters by convergent beam electron diffraction (CBED), (3) determination of partial degree of order in ternary alloys by IKL-ALCHEMI method, and (4) determination of structure factors by energy filtering CBED. The emphasis is placed on recent achievements of electron diffraction as a tool of quantitative crystallography of materials. Keywords: convergent beam electron diffraction, critical voltage effect, intersecting Kikuchi line method, atom location by channeling enhanced microanalysis, energy filtering, structure factor, lattice parameter, temperature factor, dynamical diffraction.

本文言語英語
ページ(範囲)927-937
ページ数11
ジャーナルMaterials Transactions, JIM
39
9
DOI
出版ステータス出版済み - 9 1998

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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