Reference Model of specifications toward Independent Verification and Validation

Takahiro Ando, Hirokazu Yatsu, Kenji Hisazumi, Akira Fukuda, Michihiro Matsumoto, Yasutaka Michiura

研究成果: Chapter in Book/Report/Conference proceedingConference contribution

抜粋

Independent Verification and Validation (IV&V) [1] has begun to be used in the verification phase of system development. In this paper, we present the document group which we call Reference Model that we are developing currently. The Reference Model is developed for the purpose of supporting the efficient implementation of the formal verification for requirements and design specifications in IV&V. The Reference Model shows what with formats the requirement and design specifications should be described. For developers side of IV&V, the Reference Model are useful to recognize the essential information and its notation that should be described in the document that is a target of formal verification. For verifiers side, by comparing the Reference Model and the target document of the formal verification, the Reference Models are useful to recognize which items and properties should be verified.

元の言語英語
ホスト出版物のタイトルTENCON 2015 - 2015 IEEE Region 10 Conference
出版者Institute of Electrical and Electronics Engineers Inc.
ISBN(電子版)9781479986415
DOI
出版物ステータス出版済み - 1 5 2016
イベント35th IEEE Region 10 Conference, TENCON 2015 - Macau, マカオ
継続期間: 11 1 201511 4 2015

出版物シリーズ

名前IEEE Region 10 Annual International Conference, Proceedings/TENCON
2016-January
ISSN(印刷物)2159-3442
ISSN(電子版)2159-3450

その他

その他35th IEEE Region 10 Conference, TENCON 2015
マカオ
Macau
期間11/1/1511/4/15

All Science Journal Classification (ASJC) codes

  • Computer Science Applications
  • Electrical and Electronic Engineering

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  • これを引用

    Ando, T., Yatsu, H., Hisazumi, K., Fukuda, A., Matsumoto, M., & Michiura, Y. (2016). Reference Model of specifications toward Independent Verification and Validation. : TENCON 2015 - 2015 IEEE Region 10 Conference [7372818] (IEEE Region 10 Annual International Conference, Proceedings/TENCON; 巻数 2016-January). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/TENCON.2015.7372818