Relationship between intrinsic surface resistance and critical current density of YBCO thin films with various thickness

K. Nakagawa, S. Nakayama, A. Saito, S. Ono, H. Kai, M. Mukaida, T. Honma, S. Ohshima

    研究成果: ジャーナルへの寄稿学術誌査読

    5 被引用数 (Scopus)

    抄録

    We investigated the relationship between the intrinsic surface resistance (Rints) and critical current density (Jc) of YBa2Cu3Oy (YBCO) film thinner than the penetration depth (kL). The measured YBCO films were deposited on CeO 2-buffered r-cut Al2O3 substrates by the pulsed laser deposition method. The thicknesses of these films were 300, 200, and 100 nm, respectively. The Rints means the surface resistance of YBCO film removing the loss by the impedance of the substrates. The effective surface resistance (Rf) including the impedance of the substrate and the J c of each YBCO film were measured using the dielectric resonator method at 21.8 GHz and the inductive method. We calculated Rint s by using phenomenological expressions and the Reff s value. The Rints values of each YBCO film were almost the same in the measured temperature region. As a result, we found that Rints was in inverse proportion to the Jc of YBCO film thinner than λL.

    本文言語英語
    ページ(範囲)1361-1364
    ページ数4
    ジャーナルPhysica C: Superconductivity and its applications
    470
    20
    DOI
    出版ステータス出版済み - 11月 1 2010

    !!!All Science Journal Classification (ASJC) codes

    • 電子材料、光学材料、および磁性材料
    • 凝縮系物理学
    • エネルギー工学および電力技術
    • 電子工学および電気工学

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