Rs measurement of HTS films in millimeter wave region using dielectric resonator method

M. Kusunoki, M. Inadomaru, D. Kousaka, S. Ohshima, K. Aizawa, M. Mukaida

研究成果: ジャーナルへの寄稿会議記事査読

9 被引用数 (Scopus)

抄録

The parallel plate dielectric resonator was applied to surface resistance (Rs) measurement of high temperature superconducting films with small area for the purpose of material research in early stage. Using 38 GHz resonance of TE013 mode, available measurement area in the film was diameter of 9 mm. From the theoretical calculation, the measurement at higher frequency had an advantage of less error in Rs that is caused by dielectric loss tangent (tan δ). The effect of dielectric loss is negligible at 38 GHz even using a sapphire with order of 10-7 of tan δ. In lower Rs region, Rs values of YBa 2Cu3Oy that were measured at 38 GHz agreed well with that of standard measurement method at 22 GHz. However the difference of Rs between two methods became larger with increase of R s. It is owing to poor signal to noise ratio at higher frequency.

本文言語英語
ページ(範囲)1241-1244
ページ数4
ジャーナルPhysica C: Superconductivity and its applications
392-396
PART 2
DOI
出版ステータス出版済み - 10月 1 2003
外部発表はい
イベントProceedings of the 15th International Symposium on Superconduc - Yokohama, 日本
継続期間: 11月 11 200211月 13 2002

!!!All Science Journal Classification (ASJC) codes

  • 電子材料、光学材料、および磁性材料
  • 凝縮系物理学
  • エネルギー工学および電力技術
  • 電子工学および電気工学

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