Scanning Hall-probe microscopy system for two-dimensional imaging of critical current density in RE-123 coated conductors

K. Higashikawa, M. Inoue, T. Kawaguchi, K. Shiohara, K. Imamura, T. Kiss, Y. Iijima, K. Kakimoto, T. Saitoh, T. Izumi

研究成果: Contribution to journalArticle査読

24 被引用数 (Scopus)

抄録

We have developed a characterization method for two-dimensional imaging of critical current density in coated conductors (CCs) based on scanning Hall-probe microscopy (SHPM). The distributions of the magnetic field around a sample were measured for several different conditions of external magnetic fields, and then were converted to those of the sheet current density which flowed to shield the external magnetic field or to trap the penetrated magnetic field. As a result, it was found that the amplitude of the sheet current density corresponded to that of critical current density almost in all the area of the sample except for the region where current direction changed. This indicates that we could obtain an in-plane distribution of the critical current density with a spatial resolution of around 100 μm in non-destructive manner by this method. We believe that this measurement will be a multifunctional and comprehensive characterization method for coated conductors.

本文言語英語
ページ(範囲)1036-1040
ページ数5
ジャーナルPhysica C: Superconductivity and its applications
471
21-22
DOI
出版ステータス出版済み - 11 2011

All Science Journal Classification (ASJC) codes

  • 電子材料、光学材料、および磁性材料
  • 凝縮系物理学
  • エネルギー工学および電力技術
  • 電子工学および電気工学

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