Scattering patterns and energy distribution of scattered electrons under field emission conditions of scanning tunneling microscopy

Seigi Mizuno, Jun Fukuda, Masayuki Iwanaga, Hiroshi Tochihara

    研究成果: Contribution to journalArticle査読

    7 被引用数 (Scopus)

    抄録

    A low-energy electron diffraction (LEED) apparatus using field emissions from scanning tunneling microscope (STM) tips has been developed. The apparatus was designed to detect scattered electrons toward the surface normal direction using the tip shield and the extractor. The kinetic energies of the scattered electrons were measured. There were two bright regions. One consisted of inelastically scattered electrons, while the other mainly consisted of elastically scattered electrons. The behavior of the latter region was consistent with our simple calculations. This result supports the possibility that the LEED uses field emissions from STM tips. The specific diffraction patterns of surface structures have not yet been obtained. The features of the apparatus are discussed.

    本文言語英語
    ページ(範囲)5501-5505
    ページ数5
    ジャーナルJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
    43
    8 A
    DOI
    出版ステータス出版済み - 8 1 2004

    All Science Journal Classification (ASJC) codes

    • 工学(全般)
    • 物理学および天文学(全般)

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