Searching for O-X-B mode-conversion window with monitoring of stray microwave radiation in LHD

H. Igami, S. Kubo, H. P. Laqua, K. Nagasaki, S. Inagaki, T. Notake, T. Shimozuma, Y. Yoshimura, T. Mutoh

研究成果: ジャーナルへの寄稿学術誌査読

23 被引用数 (Scopus)

抄録

In the Large Helical Device, the stray microwave radiation is monitored by using so-called sniffer probes during electron cyclotron heating. In monitoring the stray radiation, we changed the microwave beam injection angle and search the O-X-B mode-conversion window to excite electron Bernstein waves (EBWs). When the microwave beam is injected toward the vicinity of the predicted O-X-B mode-conversion window, the electron temperature rises in the central part of overdense plasmas. In that case, the stray radiation level near the injection antenna becomes low. These results indicate that monitoring the stray radiation near the injection antenna is helpful in confirming the effectiveness of excitation of EBWs simply without precise analysis.

本文言語英語
論文番号10E931
ジャーナルReview of Scientific Instruments
77
10
DOI
出版ステータス出版済み - 2006
外部発表はい

!!!All Science Journal Classification (ASJC) codes

  • 器械工学

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