Shape-controlled ZnO nanocrystals using multi-beam interference irradiation

D. Nakamura, T. Shimogaki, Y. Muraoka, S. Nakao, K. Harada, M. Higashihata, Y. Nakata, T. Okada

研究成果: Chapter in Book/Report/Conference proceedingConference contribution

抜粋

ZnO nanocrystals have received much attention as building blocks for nano/micro-devices due to their unique morphologies, electronic and optoelectronic properties. In order to apply the ZnO nanocrystals to the practical optoelectronic applications, control of the growth density, shape and position is required. We have achieved density-controlled ZnO nanowires and periodic ZnO nanostructures using laser interference patterning. Various shapes of ZnO nanostructure, such as microcylinder and aligned nanowall, were grown using interference patterned film and substrate. In addition, optically pumped ultraviolet lasing from a piece of the ZnO nanocrystal was achieved.

元の言語英語
ホスト出版物のタイトルLaser Applications in Microelectronic and Optoelectronic Manufacturing (LAMOM) XIX
出版者SPIE
ISBN(印刷物)9780819498809
DOI
出版物ステータス出版済み - 1 1 2014
イベントLaser Applications in Microelectronic and Optoelectronic Manufacturing (LAMOM) XIX - San Francisco, CA, 米国
継続期間: 2 3 20142 6 2014

出版物シリーズ

名前Proceedings of SPIE - The International Society for Optical Engineering
8967
ISSN(印刷物)0277-786X
ISSN(電子版)1996-756X

その他

その他Laser Applications in Microelectronic and Optoelectronic Manufacturing (LAMOM) XIX
米国
San Francisco, CA
期間2/3/142/6/14

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • これを引用

    Nakamura, D., Shimogaki, T., Muraoka, Y., Nakao, S., Harada, K., Higashihata, M., Nakata, Y., & Okada, T. (2014). Shape-controlled ZnO nanocrystals using multi-beam interference irradiation. : Laser Applications in Microelectronic and Optoelectronic Manufacturing (LAMOM) XIX [89671G] (Proceedings of SPIE - The International Society for Optical Engineering; 巻数 8967). SPIE. https://doi.org/10.1117/12.2039732