SIMS analysis of low content hydrogen in commercially pure titanium

Shigeru Hamada, Katsu Ohnishi, Hide Aki Nishikawa, Yasuji Oda, Hiroshi Noguchi

研究成果: ジャーナルへの寄稿レター

4 引用 (Scopus)
元の言語英語
ページ(範囲)5692-5696
ページ数5
ジャーナルJournal of Materials Science
44
発行部数20
DOI
出版物ステータス出版済み - 10 1 2009

Fingerprint

Secondary ion mass spectrometry
Titanium
Hydrogen

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Mechanics of Materials
  • Mechanical Engineering

これを引用

SIMS analysis of low content hydrogen in commercially pure titanium. / Hamada, Shigeru; Ohnishi, Katsu; Nishikawa, Hide Aki; Oda, Yasuji; Noguchi, Hiroshi.

:: Journal of Materials Science, 巻 44, 番号 20, 01.10.2009, p. 5692-5696.

研究成果: ジャーナルへの寄稿レター

Hamada, Shigeru ; Ohnishi, Katsu ; Nishikawa, Hide Aki ; Oda, Yasuji ; Noguchi, Hiroshi. / SIMS analysis of low content hydrogen in commercially pure titanium. :: Journal of Materials Science. 2009 ; 巻 44, 番号 20. pp. 5692-5696.
@article{6897de4927544790a4ed5bfb6a08a567,
title = "SIMS analysis of low content hydrogen in commercially pure titanium",
author = "Shigeru Hamada and Katsu Ohnishi and Nishikawa, {Hide Aki} and Yasuji Oda and Hiroshi Noguchi",
year = "2009",
month = "10",
day = "1",
doi = "10.1007/s10853-009-3783-2",
language = "English",
volume = "44",
pages = "5692--5696",
journal = "Journal of Materials Science",
issn = "0022-2461",
publisher = "Springer Netherlands",
number = "20",

}

TY - JOUR

T1 - SIMS analysis of low content hydrogen in commercially pure titanium

AU - Hamada, Shigeru

AU - Ohnishi, Katsu

AU - Nishikawa, Hide Aki

AU - Oda, Yasuji

AU - Noguchi, Hiroshi

PY - 2009/10/1

Y1 - 2009/10/1

UR - http://www.scopus.com/inward/record.url?scp=69549102944&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=69549102944&partnerID=8YFLogxK

U2 - 10.1007/s10853-009-3783-2

DO - 10.1007/s10853-009-3783-2

M3 - Letter

VL - 44

SP - 5692

EP - 5696

JO - Journal of Materials Science

JF - Journal of Materials Science

SN - 0022-2461

IS - 20

ER -