抄録
This study demonstrates a transmission electron microscopy based system that enables simultaneous measurements of conductivity and magnetism in a nanoscale area. A double-probe piezodriving holder is developed in order to determine the conductivity in any part of a thin-foil specimen. The conductivity measurement can be combined with electron holography, which can be used to obtain a magnetic flux map of the same area. This system can be applied extensively for the research and development of electronic and/or magnetic materials.
本文言語 | 英語 |
---|---|
論文番号 | 223103 |
ジャーナル | Applied Physics Letters |
巻 | 88 |
号 | 22 |
DOI | |
出版ステータス | 出版済み - 5月 29 2006 |
外部発表 | はい |
!!!All Science Journal Classification (ASJC) codes
- 物理学および天文学(その他)