Single Side Readout Depth of Interaction Method with Wavelength Discrimination

K. Shimazoe, A. Choghadi, H. Takahashi, K. Watanabe

研究成果: Contribution to journalArticle査読

6 被引用数 (Scopus)

抄録

Depth of interaction (DOI) information is important in the development of high-resolution detectors as it helps to reduce parallax error in positron emission tomography (PET) systems. Further, the determination of depth in the crystal is important for making scintillation crystal-based detectors in many other applications, such as the Compton imager and multi-radiation imagers. In this paper, a novel DOI method based on discrimination of the wavelength of the scintillation light emitted from a single side readout system is proposed. The single side readout facilitates flexibility in the final system in a geometrical configuration. The proposed method can be applied to stacked detectors with emissions of various wavelengths in crystals (e.g., LYSO and GAGG) and long monolithic detectors utilizing the wavelength dependence of internal light absorption. Simulations performed of the proposed discrimination principle via Monte Carlo simulation based on SLITRANI and experiments conducted using two silicon photomultipliers (SiPMs) with wavelength filters verify the feasibility of the proposed method.

本文言語英語
論文番号7419923
ページ(範囲)679-684
ページ数6
ジャーナルIEEE Transactions on Nuclear Science
63
2
DOI
出版ステータス出版済み - 4 2016
外部発表はい

All Science Journal Classification (ASJC) codes

  • 核物理学および高エネルギー物理学
  • 原子力エネルギーおよび原子力工学
  • 電子工学および電気工学

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