Site-specific stereograph of SiC(0001) surface by inverse matrix method

Fumihiko Matsui, Noriyuki Nishikayama, Naoyuki Maejima, Hirosuke Matsui, Kentaro Goto, Mie Hashimoto, Tomoaki Hatayama, Tomohiro Matsushita, Yukako Kato, Satoru Tanaka, Hiroshi Daimon

研究成果: ジャーナルへの寄稿記事

15 引用 (Scopus)

抄録

The 2π-steradian (full hemisphere) Si 2p and C 1s photoelectron intensity angular distributions (PIADs) of the 6H-SiC(0001) surface 4° off towards the [11̄00] direction were measured. In a bulk crystal, pairs of mirrored local atomic sites with respect to the {11̄00} planes exist. Thus, a sixfold symmetry is expected for PIADs from the bulk. However, all the measured PIADs showed a threefold symmetry owing to the preferential appearance of terraces with one type of local atomic site caused by anisotropic step bunching along the [112̄0] direction. Taking the finite inelastic mean free path of photoelectrons into account, PIADs for one kind of Si and C atomic sites were successfully derived by solving an inverse matrix. Three strong forward focusing peaks due to nearby Si and C atoms have been separated from those formed by farther atoms. They showed a circular dichroism of rotational shift around the incident-light axis, which corresponds to the parallax in stereo viewing.

元の言語英語
記事番号013601
ジャーナルjournal of the physical society of japan
80
発行部数1
DOI
出版物ステータス出版済み - 1 1 2011

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matrix methods
photoelectrons
angular distribution
parallax
bunching
symmetry
hemispheres
mean free path
dichroism
atoms
shift
matrices
crystals

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

これを引用

Matsui, F., Nishikayama, N., Maejima, N., Matsui, H., Goto, K., Hashimoto, M., ... Daimon, H. (2011). Site-specific stereograph of SiC(0001) surface by inverse matrix method. journal of the physical society of japan, 80(1), [013601]. https://doi.org/10.1143/JPSJ.80.013601

Site-specific stereograph of SiC(0001) surface by inverse matrix method. / Matsui, Fumihiko; Nishikayama, Noriyuki; Maejima, Naoyuki; Matsui, Hirosuke; Goto, Kentaro; Hashimoto, Mie; Hatayama, Tomoaki; Matsushita, Tomohiro; Kato, Yukako; Tanaka, Satoru; Daimon, Hiroshi.

:: journal of the physical society of japan, 巻 80, 番号 1, 013601, 01.01.2011.

研究成果: ジャーナルへの寄稿記事

Matsui, F, Nishikayama, N, Maejima, N, Matsui, H, Goto, K, Hashimoto, M, Hatayama, T, Matsushita, T, Kato, Y, Tanaka, S & Daimon, H 2011, 'Site-specific stereograph of SiC(0001) surface by inverse matrix method', journal of the physical society of japan, 巻. 80, 番号 1, 013601. https://doi.org/10.1143/JPSJ.80.013601
Matsui F, Nishikayama N, Maejima N, Matsui H, Goto K, Hashimoto M その他. Site-specific stereograph of SiC(0001) surface by inverse matrix method. journal of the physical society of japan. 2011 1 1;80(1). 013601. https://doi.org/10.1143/JPSJ.80.013601
Matsui, Fumihiko ; Nishikayama, Noriyuki ; Maejima, Naoyuki ; Matsui, Hirosuke ; Goto, Kentaro ; Hashimoto, Mie ; Hatayama, Tomoaki ; Matsushita, Tomohiro ; Kato, Yukako ; Tanaka, Satoru ; Daimon, Hiroshi. / Site-specific stereograph of SiC(0001) surface by inverse matrix method. :: journal of the physical society of japan. 2011 ; 巻 80, 番号 1.
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