Six-fold coordinated silicon at grain boundaries in sintered α-Al2O3

Kenji Kaneko, Isao Tanaka, Masato Yoshiya

研究成果: Contribution to journalArticle査読

7 被引用数 (Scopus)

抄録

High-resolution transmission electron microscopy (HRTEM) and analytical electron microscopy (AEM) have been carried out on Si-doped sintered α-Al2O3. HRTEM shows that there is no amorphous phase at grain boundaries. The Si-segregated boundary is found to be much more sensitive to irradiation damage than undoped Al2O3 grain boundaries. AEM with energy dispersive x-ray spectroscopy (EDS) shows the significant segregation of Si at grain boundaries, and AEM with electron energy-loss spectroscopy (EELS) reveals the existence of six-fold coordinated Si at the grain boundaries. The theoretical calculations obtained by the molecular orbital method support the data obtained by EELS.

本文言語英語
ページ(範囲)191-193
ページ数3
ジャーナルApplied Physics Letters
72
2
DOI
出版ステータス出版済み - 12 1 1998
外部発表はい

All Science Journal Classification (ASJC) codes

  • 物理学および天文学(その他)

フィンガープリント

「Six-fold coordinated silicon at grain boundaries in sintered α-Al<sub>2</sub>O<sub>3</sub>」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル