Soft X-ray measurement in IRE on the TST-2 spherical tokamak

K. Sasaki, K. Hanada, K. N. Sato, H. Zushi, K. Nakamura, M. Sakamoto, H. Idei, M. Hasegawa, S. Kawasaki, T. Nakashima, A. Higashijima, Y. Takase, A. Ejiri, S. Shiraiwa, H. Kasahara, T. Yamada, N. Nishino

研究成果: Chapter in Book/Report/Conference proceedingConference contribution

抄録

Internal Reconnection Event (IRE) is a characteristic relaxation phenomenon in STs (Sperical Tokamaks). To investigate the deformation of the plasma shape during IRE, four PIN diode arrays of 20 channels were installed on the TST-2@K (TST-2 at Kyushu University). Precursor of IRE was observed for several milli-seconds. The fluctuation was composed of two dominant components in frequency of 10kHz and 4kHz. The mode structure of 10kHz component is n/m=1/1 helical structure and 4kHz is n/m= 3/4. The overlap of modes (10kHz and 4kHz) was considered to be cause of IRE in TST-2 from the position and the growth of the modes.

本文言語英語
ホスト出版物のタイトル33rd EPS Conference on Plasma Physics 2006, EPS 2006 - Europhysics Conference Abstracts
ページ1640-1643
ページ数4
出版ステータス出版済み - 2006
イベント33rd European Physical Society Conference on Plasma Physics 2006, EPS 2006 - Rome, イタリア
継続期間: 6 19 20066 23 2006

出版物シリーズ

名前33rd EPS Conference on Plasma Physics 2006, EPS 2006
3

その他

その他33rd European Physical Society Conference on Plasma Physics 2006, EPS 2006
Countryイタリア
CityRome
Period6/19/066/23/06

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics

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