Stacking domains of epitaxial few-layer graphene on SiC(0001)

H. Hibino, S. Mizuno, H. Kageshima, M. Nagase, H. Yamaguchi

    研究成果: Contribution to journalArticle

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    We used low-energy electron microscopy (LEEM) and scanning tunneling microscopy (STM) to investigate domain structures of epitaxial few-layer graphene grown on SiC(0001). Dark-field (DF) LEEM images formed using (10) and (01) beams clearly indicate that bilayer graphene consists of two types of domains, which have threefold symmetry and are rotated by 180°with respect to each other. The DF LEEM images show clear domain contrasts at energies where (10)- and (01)-beam intensities calculated for bulk graphite are largely different. This means that the two types of domains are different in stacking: AB and AC stackings. The stacking domains are also supported by the STM images of bilayer graphene showing both hexagonal and honeycomb patterns.

    元の言語英語
    記事番号085406
    ジャーナルPhysical Review B - Condensed Matter and Materials Physics
    80
    発行部数8
    DOI
    出版物ステータス出版済み - 8 6 2009

    All Science Journal Classification (ASJC) codes

    • Electronic, Optical and Magnetic Materials
    • Condensed Matter Physics

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