TY - GEN
T1 - Stress Analysis of SiC Bulk Single Crystal Growth by Sublimation Method
AU - Nishizawa, Shin Ichi
AU - Michikawa, Yumi
AU - Kato, Tomohisa
AU - Hirose, Fusao
AU - Oyanagi, Naoki
AU - Arai, Kazuo
PY - 2003/1/1
Y1 - 2003/1/1
N2 - In order to grow a high quality SiC bulk single crystal, it is important to moderate the residual stress in the grown crystal. The residual stress is affected by not only the temperature distribution, but also by the boundary conditions. In this study, firstly, the effect of the polycrystal and of the crucible walls on the stress distribution was numerically analyzed. The effect of the grown crystal shape on the residual stress was also analyzed and compared to the growth experiment. It is pointed out that in order to moderate the residual stress, it is necessary to take care not only of the temperature distribution but also of the boundary conditions.
AB - In order to grow a high quality SiC bulk single crystal, it is important to moderate the residual stress in the grown crystal. The residual stress is affected by not only the temperature distribution, but also by the boundary conditions. In this study, firstly, the effect of the polycrystal and of the crucible walls on the stress distribution was numerically analyzed. The effect of the grown crystal shape on the residual stress was also analyzed and compared to the growth experiment. It is pointed out that in order to moderate the residual stress, it is necessary to take care not only of the temperature distribution but also of the boundary conditions.
UR - http://www.scopus.com/inward/record.url?scp=0242665544&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0242665544&partnerID=8YFLogxK
U2 - 10.4028/www.scientific.net/msf.433-436.13
DO - 10.4028/www.scientific.net/msf.433-436.13
M3 - Conference contribution
AN - SCOPUS:0242665544
SN - 9780878499205
T3 - Materials Science Forum
SP - 13
EP - 16
BT - Materials Science Forum
A2 - Bergman, Peder
A2 - Janzén, Erik
PB - Trans Tech Publications Ltd
T2 - Proceedings of the 4th European Conference on Silicon Carbide and Related Materials
Y2 - 2 September 2002 through 5 September 2002
ER -