### 抜粋

Strong feasibility (a.k.a. strict feasibility) of the dual problem of a given linear matrix inequality (LMI) is an important property to guarantee the existence of an optimal solution of the LMI problem. In particular, the LMI problem may not have any optimal solutions if the dual is not strongly feasible. This implies that the computed solutions by SDP solvers may be meaningless and useless for designing the controllers of H_{∞} output feedback control problems. The facial reduction is a tool to analyze and reduce such non-strongly feasible problems. We introduce the strong feasibility of the dual and facial reduction and provide the necessary and sufficient condition on the strong feasibility. Furthermore, we reveal that the condition is closely related to invariant zeros in the plant.

元の言語 | 英語 |
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ホスト出版物のタイトル | SICE ISCS 2018 - 2018 SICE International Symposium on Control Systems |

出版者 | Institute of Electrical and Electronics Engineers Inc. |

ページ | 47-53 |

ページ数 | 7 |

ISBN（電子版） | 9784907764586 |

DOI | |

出版物ステータス | 出版済み - 4 2 2018 |

イベント | 2018 SICE International Symposium on Control Systems, SICE ISCS 2018 - Tokyo, 日本 継続期間: 3 9 2018 → 3 11 2018 |

### 出版物シリーズ

名前 | SICE ISCS 2018 - 2018 SICE International Symposium on Control Systems |
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巻 | 2018-January |

### その他

その他 | 2018 SICE International Symposium on Control Systems, SICE ISCS 2018 |
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国 | 日本 |

市 | Tokyo |

期間 | 3/9/18 → 3/11/18 |

### All Science Journal Classification (ASJC) codes

- Process Chemistry and Technology
- Energy Engineering and Power Technology
- Electrical and Electronic Engineering
- Control and Optimization

## フィンガープリント Strong feasibility of the dual problem of linear matrix inequality for H<sub>∞</sub> output feedback control problem' の研究トピックを掘り下げます。これらはともに一意のフィンガープリントを構成します。

## これを引用

_{∞}output feedback control problem. ：

*SICE ISCS 2018 - 2018 SICE International Symposium on Control Systems*(pp. 47-53). (SICE ISCS 2018 - 2018 SICE International Symposium on Control Systems; 巻数 2018-January). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.23919/SICEISCS.2018.8330155