Structural and electrical properties of polycrystalline Bi 4-xNdxTi3O12 ferroelectric thin films with in-plane c-axis orientations

Hirofumi Matsuda, Masahiro Kurachi, Hiroshi Uchida, Takayuki Watanabe, Takashi Iijima, Seiichiro Koda, Hiroshi Funakubo

研究成果: Contribution to journalArticle査読

4 被引用数 (Scopus)

抄録

Bi4-xNdxTi3O12 (BNT, x = 0.25, 0.5, 0.75) thin films with in-plane c-axis orientations were grown on IrO 2/Si from solution route and their electrical properties were studied. The remanent polarization exhibited a broad peak against x with the maximum value of 2Pr = 47 μC/cm2 at x = 0.5. The orthorhombic lattice parameters and Curie temperature TC were measured for BNT powders prepared from the same coating solutions. Both orthorhombic anisotropy a/b and TC monotonically decreased with increasing x. Irrespective of x, leakage current density J < 1.5 × 10-7 A/cm2 under 100 kV/cm was observed by optimizing film growth temperature TG = 700°C, even though the Bi 2O2: blocking layers aligned perpendicular to the film.

本文言語英語
ページ(範囲)L292-L294
ジャーナルJapanese Journal of Applied Physics, Part 2: Letters
44
8-11
DOI
出版ステータス出版済み - 6 13 2005
外部発表はい

All Science Journal Classification (ASJC) codes

  • 工学(全般)
  • 物理学および天文学(その他)
  • 物理学および天文学(全般)

フィンガープリント

「Structural and electrical properties of polycrystalline Bi <sub>4-x</sub>Nd<sub>x</sub>Ti<sub>3</sub>O<sub>12</sub> ferroelectric thin films with in-plane c-axis orientations」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル