Structural characterization of a-axis oriented YBa2Cu3Ox films grown by liquid phase epitaxy

M. Mukaida, S. Miyazawa, C. Klemenz, H. J. Scheel

研究成果: ジャーナルへの寄稿学術誌査読

9 被引用数 (Scopus)

抄録

YBa2Cu3Ox films on low-misfit LaxNd1-xGaO3 (110) substrates grown by liquid phase epitaxy (LPE) are investigated in the as-grown state by X-ray diffraction, polarized optical microscopy, atomic force microscopy (AFM), and transmission electron microscopy (TEM). The preferred orientation axis of the film normal to the substrate surface is the a-/b-axis with twins, as observed by θ/2θ-scan, polarized optical micrographs, and cross-sectional view TEM images. In-plane alignment of the c-axis in the films is confirmed by X-ray φ-scan and plane-view TEM images. Defects running perpendicular to the c-axis direction were clearly observed in the plane-view TEM images. These defects consist of excess CuO chains localized in the BaO-BaO interlayers forming (CuO)n layers, similar to that in Y2Ba4Cu8Ox (248 phase).

本文言語英語
ページ(範囲)715-721
ページ数7
ジャーナルJournal of Crystal Growth
169
4
DOI
出版ステータス出版済み - 12月 1 1996
外部発表はい

!!!All Science Journal Classification (ASJC) codes

  • 凝縮系物理学
  • 無機化学
  • 材料化学

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