抄録
Zn-Nb films were formed on a steel sheet by helicon plasma sputtering in an argon gas atmosphere at 1.0 Pa, at RF power of 50 W and DC power of 50 mA. The structure and polarization properties of these films were studied using EPMA, X-ray diffraction and polarization curve measurements. Zn plate-like crystals in Zn-Nb films decreased with increasing Nb content, resulting in a smooth surface over the entire film at Nb content of 30 mass% and above. The preferred orientation plane of Zn plate-like crystals was (0002) at 0 mass% Nb, while the orientation indices of (101̄1) and (101̄0)Zn increased with rising Nb content. At 30-60 mass% Nb, the X-ray diffraction spectra showed a halo pattern characteristic of an amorphous structure. The corrosion current of Zn-Nb films, which was determined by polarization curves in 3% NaCl solution, decreased with increasing Nb content to reach a minimum value at 30-60 mass% Nb, corresponding to an amorphous structure.
| 元の言語 | 英語 |
|---|---|
| ページ（範囲） | 1205-1209 |
| ページ数 | 5 |
| ジャーナル | isij international |
| 巻 | 46 |
| 発行部数 | 8 |
| DOI | |
| 出版物ステータス | 出版済み - 10 23 2006 |
Fingerprint
All Science Journal Classification (ASJC) codes
- Mechanics of Materials
- Mechanical Engineering
- Metals and Alloys
- Materials Chemistry
これを引用
Structure and polarization properties of Zn-Nb films formed on steel sheet by sputtering. / Kuboyama, Hiroshi; Nakano, Hiroaki; Oue, Satoshi; Fukushima, Hisaaki; Masuda, Masataka; Hashimoto, Shunichi.
：: isij international, 巻 46, 番号 8, 23.10.2006, p. 1205-1209.研究成果: ジャーナルへの寄稿 › 記事
}
TY - JOUR
T1 - Structure and polarization properties of Zn-Nb films formed on steel sheet by sputtering
AU - Kuboyama, Hiroshi
AU - Nakano, Hiroaki
AU - Oue, Satoshi
AU - Fukushima, Hisaaki
AU - Masuda, Masataka
AU - Hashimoto, Shunichi
PY - 2006/10/23
Y1 - 2006/10/23
N2 - Zn-Nb films were formed on a steel sheet by helicon plasma sputtering in an argon gas atmosphere at 1.0 Pa, at RF power of 50 W and DC power of 50 mA. The structure and polarization properties of these films were studied using EPMA, X-ray diffraction and polarization curve measurements. Zn plate-like crystals in Zn-Nb films decreased with increasing Nb content, resulting in a smooth surface over the entire film at Nb content of 30 mass% and above. The preferred orientation plane of Zn plate-like crystals was (0002) at 0 mass% Nb, while the orientation indices of (101̄1) and (101̄0)Zn increased with rising Nb content. At 30-60 mass% Nb, the X-ray diffraction spectra showed a halo pattern characteristic of an amorphous structure. The corrosion current of Zn-Nb films, which was determined by polarization curves in 3% NaCl solution, decreased with increasing Nb content to reach a minimum value at 30-60 mass% Nb, corresponding to an amorphous structure.
AB - Zn-Nb films were formed on a steel sheet by helicon plasma sputtering in an argon gas atmosphere at 1.0 Pa, at RF power of 50 W and DC power of 50 mA. The structure and polarization properties of these films were studied using EPMA, X-ray diffraction and polarization curve measurements. Zn plate-like crystals in Zn-Nb films decreased with increasing Nb content, resulting in a smooth surface over the entire film at Nb content of 30 mass% and above. The preferred orientation plane of Zn plate-like crystals was (0002) at 0 mass% Nb, while the orientation indices of (101̄1) and (101̄0)Zn increased with rising Nb content. At 30-60 mass% Nb, the X-ray diffraction spectra showed a halo pattern characteristic of an amorphous structure. The corrosion current of Zn-Nb films, which was determined by polarization curves in 3% NaCl solution, decreased with increasing Nb content to reach a minimum value at 30-60 mass% Nb, corresponding to an amorphous structure.
UR - http://www.scopus.com/inward/record.url?scp=33750064836&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=33750064836&partnerID=8YFLogxK
U2 - 10.2355/isijinternational.46.1205
DO - 10.2355/isijinternational.46.1205
M3 - Article
AN - SCOPUS:33750064836
VL - 46
SP - 1205
EP - 1209
JO - ISIJ International
JF - ISIJ International
SN - 0915-1559
IS - 8
ER -