Study for surface analysis on thin film by chemical force microscope

Shieeki Nakahara, Tomoyuki Koga, Atsushi Takahara

研究成果: Contribution to conferencePaper査読

抄録

Distribution of surface functional groups were analyzed with a scanning force microscope with chemically modified cantilever tip. The relative difference of lateral force between two components monolayers strongly depended on the combination of terminal functional groups at the cantilever and sample surfaces due to chemical interaction between chemically modified cantilever tip and substrate surface.

本文言語英語
ページ1123
ページ数1
出版ステータス出版済み - 2006
イベント55th SPSJ Annual Meeting - Nagoya, 日本
継続期間: 5 24 20065 26 2006

その他

その他55th SPSJ Annual Meeting
国/地域日本
CityNagoya
Period5/24/065/26/06

All Science Journal Classification (ASJC) codes

  • 工学(全般)

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