Study for surface analysis on thin film by chemical force microscope

Shieeki Nakahara, Tomoyuki Koga, Atsushi Takahara

研究成果: 会議への寄与タイプ論文

抄録

Distribution of surface functional groups were analyzed with a scanning force microscope with chemically modified cantilever tip. The relative difference of lateral force between two components monolayers strongly depended on the combination of terminal functional groups at the cantilever and sample surfaces due to chemical interaction between chemically modified cantilever tip and substrate surface.

元の言語英語
ページ数1
出版物ステータス出版済み - 10 18 2006
イベント55th SPSJ Annual Meeting - Nagoya, 日本
継続期間: 5 24 20065 26 2006

その他

その他55th SPSJ Annual Meeting
日本
Nagoya
期間5/24/065/26/06

Fingerprint

Surface analysis
Surface chemistry
Monolayers
Microscopes
Scanning
Thin films
Functional groups
Substrates

All Science Journal Classification (ASJC) codes

  • Engineering(all)

これを引用

Nakahara, S., Koga, T., & Takahara, A. (2006). Study for surface analysis on thin film by chemical force microscope. 論文発表場所 55th SPSJ Annual Meeting, Nagoya, 日本.

Study for surface analysis on thin film by chemical force microscope. / Nakahara, Shieeki; Koga, Tomoyuki; Takahara, Atsushi.

2006. 論文発表場所 55th SPSJ Annual Meeting, Nagoya, 日本.

研究成果: 会議への寄与タイプ論文

Nakahara, S, Koga, T & Takahara, A 2006, 'Study for surface analysis on thin film by chemical force microscope' 論文発表場所 55th SPSJ Annual Meeting, Nagoya, 日本, 5/24/06 - 5/26/06, .
Nakahara S, Koga T, Takahara A. Study for surface analysis on thin film by chemical force microscope. 2006. 論文発表場所 55th SPSJ Annual Meeting, Nagoya, 日本.
Nakahara, Shieeki ; Koga, Tomoyuki ; Takahara, Atsushi. / Study for surface analysis on thin film by chemical force microscope. 論文発表場所 55th SPSJ Annual Meeting, Nagoya, 日本.1 p.
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