### 抜粋

A code design problem for memory devices with restricted state transitions is formulated as a combinatorial optimization problem that is called a subgraph domatic partition (subDP) problem. If any neighbor set of a given state transition graph contains all the colors, then the coloring is said to be valid. The goal of a subDP problem is to find the valid coloring that has the largest number of colors for a subgraph of a given directed graph. The number of colors in an optimal valid coloring indicates the writing capacity of that state transition graph. The subDP problems are computationally hard; it is proved to be NP-complete in this paper. One of our main contributions in this paper is to show the asymptotic behavior of the writing capacity C(G) for sequences of dense bidirectional graphs; this is given by C(G) = Ω(n/ ln n), where n is the number of nodes. A probabilistic method, Lovász local lemma (LLL), plays an essential role in deriving the asymptotic expression.

元の言語 | 英語 |
---|---|

ホスト出版物のタイトル | Proceedings - 2015 IEEE International Symposium on Information Theory, ISIT 2015 |

出版者 | Institute of Electrical and Electronics Engineers Inc. |

ページ | 1307-1311 |

ページ数 | 5 |

ISBN（電子版） | 9781467377041 |

DOI | |

出版物ステータス | 出版済み - 9 28 2015 |

イベント | IEEE International Symposium on Information Theory, ISIT 2015 - Hong Kong, 香港 継続期間: 6 14 2015 → 6 19 2015 |

### 出版物シリーズ

名前 | IEEE International Symposium on Information Theory - Proceedings |
---|---|

巻 | 2015-June |

ISSN（印刷物） | 2157-8095 |

### その他

その他 | IEEE International Symposium on Information Theory, ISIT 2015 |
---|---|

国 | 香港 |

市 | Hong Kong |

期間 | 6/14/15 → 6/19/15 |

### フィンガープリント

### All Science Journal Classification (ASJC) codes

- Theoretical Computer Science
- Information Systems
- Modelling and Simulation
- Applied Mathematics

### これを引用

*Proceedings - 2015 IEEE International Symposium on Information Theory, ISIT 2015*(pp. 1307-1311). [7282667] (IEEE International Symposium on Information Theory - Proceedings; 巻数 2015-June). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISIT.2015.7282667