TY - JOUR
T1 - Symmetry-dependent defect structures in soft-mode turbulence
AU - Anugraha, Rinto
AU - Hidaka, Yoshiki
AU - Ueki, Tatsuhiro
AU - Kai, Shoichi
N1 - Copyright:
Copyright 2009 Elsevier B.V., All rights reserved.
PY - 2009/10/6
Y1 - 2009/10/6
N2 - In the soft-mode turbulence (SMT) in electroconvection of homeotropic nematic systems, which is a kind of spatiotemporal chaos induced by nonlinear interaction between two two-dimensional (2D) XY fields, the Nambu-Goldstone modes, and the convective modes, a curious line structure called blackline has been discovered. We measured the density of the blackline as a function of control parameters, ac voltage, and frequency. By detailed observations and analysis, it is clarified that the blackline is a structure of the nematic director in the x-y plane and includes a sequence of point defects. We discussed similarity with the density of the blackline and that of the point defect in the conventional 2D XY model. The occurrence of this type of defects is only due to the symmetry in the SMT and independent of the properties of fluctuations.
AB - In the soft-mode turbulence (SMT) in electroconvection of homeotropic nematic systems, which is a kind of spatiotemporal chaos induced by nonlinear interaction between two two-dimensional (2D) XY fields, the Nambu-Goldstone modes, and the convective modes, a curious line structure called blackline has been discovered. We measured the density of the blackline as a function of control parameters, ac voltage, and frequency. By detailed observations and analysis, it is clarified that the blackline is a structure of the nematic director in the x-y plane and includes a sequence of point defects. We discussed similarity with the density of the blackline and that of the point defect in the conventional 2D XY model. The occurrence of this type of defects is only due to the symmetry in the SMT and independent of the properties of fluctuations.
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U2 - 10.1103/PhysRevE.80.041701
DO - 10.1103/PhysRevE.80.041701
M3 - Article
AN - SCOPUS:70449371584
VL - 80
JO - Physical Review E
JF - Physical Review E
SN - 2470-0045
IS - 4
M1 - 041701
ER -