TY - JOUR
T1 - Synthesis of phosphorus-doped homoepitaxial diamond by microwave plasma-assisted chemical vapor deposition using triethylphosphine as the dopant
AU - Saito, T.
AU - Kameta, M.
AU - Kusakabe, K.
AU - Morooka, S.
AU - Maeda, H.
AU - Asano, T.
N1 - Funding Information:
This study was partially supported by a Grant-in-Aid for Scientific Research from the Ministry of Education, Science, Sports and Culture, Japan, and the Research Project for Fundamental Engineering of CVD, organized by Professor Hiroshi Komiyama, The University of Tokyo. Silicon substrates were supplied by Sumitomo Sitix Corporation.
PY - 1998/2
Y1 - 1998/2
N2 - Triethylphosphine [TEP, P(C2H5)3] was used as a dopant for homoepitaxial (100) and (111) phosphorus-doped diamond films, which were formed by microwave plasma-assisted chemical vapor deposition using CH4 as the carbon source. The growth rate of TEP-doped (100) diamond increased with increasing atomic ratio of phosphorus to carbon in the gas phase, from 300 nm h-1 at 0 ppm to 800 nm h-1 at 10 000 ppm at 850 °C. TEP-doped (100) diamond films deposited at temperatures below 850 °C were smooth and homoepitaxial, whereas those deposited above 950 °C as well as the TEP-doped (111) films formed at 750-1050 °C were polycrystalline. Phosphorus was found to be uniformly incorporated into the diamond film, as evidenced by secondary ion mass spectrometry. The Hall conductivity of the TEP-doped films remained low.
AB - Triethylphosphine [TEP, P(C2H5)3] was used as a dopant for homoepitaxial (100) and (111) phosphorus-doped diamond films, which were formed by microwave plasma-assisted chemical vapor deposition using CH4 as the carbon source. The growth rate of TEP-doped (100) diamond increased with increasing atomic ratio of phosphorus to carbon in the gas phase, from 300 nm h-1 at 0 ppm to 800 nm h-1 at 10 000 ppm at 850 °C. TEP-doped (100) diamond films deposited at temperatures below 850 °C were smooth and homoepitaxial, whereas those deposited above 950 °C as well as the TEP-doped (111) films formed at 750-1050 °C were polycrystalline. Phosphorus was found to be uniformly incorporated into the diamond film, as evidenced by secondary ion mass spectrometry. The Hall conductivity of the TEP-doped films remained low.
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U2 - 10.1016/s0925-9635(97)00272-0
DO - 10.1016/s0925-9635(97)00272-0
M3 - Article
AN - SCOPUS:0031995529
VL - 7
SP - 560
EP - 564
JO - Diamond and Related Materials
JF - Diamond and Related Materials
SN - 0925-9635
IS - 2-5
ER -