抄録
The synthesis of platinum silicide at a Pt/SiOx interface by photon irradiation was investigated using transmission electron microscopy. A platinum silicide, Pt2Si, was successfully formed at the Pt/SiOx interface by irradiation with 680 and 140 eV photons, but not by irradiation with 80 eV photons. Silicide formation was also induced by irradiation with electrons of energy 75 keV. The amount of silicide formed by photon irradiation was lower than the amount obtained by electron irradiation. Silicide formation by both photon and electron irradiation was accompanied by Si depletion in amorphous SiOx. The experimental results indicate that silicide formation is induced by electronic excitation. A possible mechanism for silicide formation is proposed on the basis of the results.
本文言語 | 英語 |
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ページ(範囲) | 284-294 |
ページ数 | 11 |
ジャーナル | Acta Materialia |
巻 | 154 |
DOI | |
出版ステータス | 出版済み - 8月 1 2018 |
!!!All Science Journal Classification (ASJC) codes
- 電子材料、光学材料、および磁性材料
- セラミックおよび複合材料
- ポリマーおよびプラスチック
- 金属および合金