抄録
<p>We have developed a unique methodology and a new hardware/software-integrated system for in-situ straining and electron tomography (ET) experiments. The central software of the system controls a straining-and-tomography specimen holder, imaging devices and the specimen stage of a transmission electron microscope (TEM) in an integrated manner. Using the system, one can perform in-situ time-resolved three-dimensional (3D) studies that explore in real-time and at sub-microscopic levels the internal behavior of materials subjected to external stresses. 3D visualization of a Pb–Sn solder alloy thin foil's deformation dynamics by iterative step-wise stress loading and tilt-series data sets acquisition is introduced as an application of the system.</p>
| 寄稿の翻訳タイトル | Development of An <i>In-Situ</i> Straining and Tomography System in TEM |
|---|---|
| 本文言語 | 日本語 |
| ページ（範囲） | 44-48 |
| ページ数 | 5 |
| ジャーナル | Kenbikyo |
| 巻 | 54 |
| 号 | 1 |
| DOI | |
| 出版ステータス | 出版済み - 2019 |