Temperature dependent X-ray absorption spectroscopy of the valence transition in EuNi2(Si0.20Ge0.80)2

Kazuya Yamamoto, Koji Horiba, Munetaka Taguchi, Masaharu Matsunami, Nozomu Kamakura, Yasutaka Takata, Ashish Chainani, Kojiro Mimura, Masayuki Shiga, Hirofumi Wada, Yasunori Senba, Haruhiko Ohashi, Shik Shin

研究成果: Contribution to journalArticle査読

1 被引用数 (Scopus)

抄録

We investigate the temperature induced mixed valence transition in EuNi2(Si0.2Ge0.8)2 using Eu 3d-4f X-ray absorption spectroscopy (XAS). The unoccupied 4f states are studied as a function of temperature (27-120 K), across the critical valence temperature, Tv = 80 K. The Eu 3d-4f X-ray absorption spectra show systematic changes of the mixed valency with temperature. The Eu2 + and Eu3 + spectral features match very well with atomic multiplet calculations. The observed non-integral mean valence changes systematically from ∼ 2.70 ± 0.03 (27 K) to ∼ 2.35 ± 0.03 (120 K), consistent with bulk-sensitive measurements.

本文言語英語
ページ(範囲)681-682
ページ数2
ジャーナルPhysica B: Condensed Matter
378-380
SPEC. ISS.
DOI
出版ステータス出版済み - 5 1 2006
外部発表はい

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

フィンガープリント 「Temperature dependent X-ray absorption spectroscopy of the valence transition in EuNi<sub>2</sub>(Si<sub>0.20</sub>Ge<sub>0.80</sub>)<sub>2</sub>」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

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