Temperature mapping on a suspended carbon nanotube using electron thermal microscopy

Koji Takahashi, Kazuma Nomoto, Tatsuya Ikuta

研究成果: 著書/レポートタイプへの貢献会議での発言

抄録

Nanoscale thermal mapping along an individual multi-walled carbon nanotube suspended between two electrodes/heat-sinks was successfully demonstrated by using the solid/liquid phase transition of indium nanoparticles in a transmission electron microscope. The brightness shift of nanoparticles in the dark-field image was clearly recognized according to the DC heating of the nanotube. It was also found that the indium deposition induces defects in the nanotube, resulting in the decrease of thermal conductivity. The temperature distribution along the nanotube obtained from the dark-field images showed good agreement with the simulated data of a defective nanotube with Joule-heating.

元の言語英語
ホスト出版物のタイトルIEEE-NANO 2015 - 15th International Conference on Nanotechnology
出版者Institute of Electrical and Electronics Engineers Inc.
ページ781-784
ページ数4
ISBN(電子版)9781467381550
DOI
出版物ステータス出版済み - 1 1 2015
イベント15th IEEE International Conference on Nanotechnology, IEEE-NANO 2015 - Rome, イタリア
継続期間: 7 27 20157 30 2015

その他

その他15th IEEE International Conference on Nanotechnology, IEEE-NANO 2015
イタリア
Rome
期間7/27/157/30/15

Fingerprint

Carbon Nanotubes
Nanotubes
Carbon nanotubes
Microscopic examination
Indium
Electrons
Nanoparticles
Temperature
Joule heating
Heat sinks
Luminance
Thermal conductivity
Temperature distribution
Electron microscopes
Phase transitions
Heating
Defects
Electrodes
Hot Temperature
Liquids

All Science Journal Classification (ASJC) codes

  • Process Chemistry and Technology
  • Electrical and Electronic Engineering
  • Ceramics and Composites
  • Electronic, Optical and Magnetic Materials
  • Surfaces, Coatings and Films

これを引用

Takahashi, K., Nomoto, K., & Ikuta, T. (2015). Temperature mapping on a suspended carbon nanotube using electron thermal microscopy. : IEEE-NANO 2015 - 15th International Conference on Nanotechnology (pp. 781-784). [7388726] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/NANO.2015.7388726

Temperature mapping on a suspended carbon nanotube using electron thermal microscopy. / Takahashi, Koji; Nomoto, Kazuma; Ikuta, Tatsuya.

IEEE-NANO 2015 - 15th International Conference on Nanotechnology. Institute of Electrical and Electronics Engineers Inc., 2015. p. 781-784 7388726.

研究成果: 著書/レポートタイプへの貢献会議での発言

Takahashi, K, Nomoto, K & Ikuta, T 2015, Temperature mapping on a suspended carbon nanotube using electron thermal microscopy. : IEEE-NANO 2015 - 15th International Conference on Nanotechnology., 7388726, Institute of Electrical and Electronics Engineers Inc., pp. 781-784, 15th IEEE International Conference on Nanotechnology, IEEE-NANO 2015, Rome, イタリア, 7/27/15. https://doi.org/10.1109/NANO.2015.7388726
Takahashi K, Nomoto K, Ikuta T. Temperature mapping on a suspended carbon nanotube using electron thermal microscopy. : IEEE-NANO 2015 - 15th International Conference on Nanotechnology. Institute of Electrical and Electronics Engineers Inc. 2015. p. 781-784. 7388726 https://doi.org/10.1109/NANO.2015.7388726
Takahashi, Koji ; Nomoto, Kazuma ; Ikuta, Tatsuya. / Temperature mapping on a suspended carbon nanotube using electron thermal microscopy. IEEE-NANO 2015 - 15th International Conference on Nanotechnology. Institute of Electrical and Electronics Engineers Inc., 2015. pp. 781-784
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