We have examined the correlation between the critical current density (Jc) and the surface resistance (R(s)) of an YBa2Cu3O7-δ (YBCO) thin film. YBCO films were prepared in an inductively coupled plasma sputtering system on MgO and BSO/MgO substrates. BaSnO3 (BSO) was used as a buffer material for the MgO substrates. Jc was determined by magnetic measurements, and Rs was measured using a sapphire rod resonator method. The correlation of critical current and surface resistance has been reported previously, however, there is few researches in which a systematic correlation of Rs and Jc using the same sample has been done. To begin with, we measured Rs by the dielectric resonator method, and next, Jc was measured using the magnetic field method. As a result, it was proven that there was a strong correlation between Rs and Jc. We found that the relationship between Jc and Rs (at 22 GHz) could be expressed by the following equation, Rs = 2.0 × 107Jc-1, where the unit of R(s) is the ohm, and the unit of Jc is A/m2. It was found that the relation was applicable in a wide temperature range under Tc. The value of the surface resistance can be estimated, if an accurate critical current is obtained.
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