The correlation of the critical current density and surface resistance of YBa2Cu3O7-δ thin films

S. Ohshima, S. Oikawa, T. Noguchi, M. Inadomaru, M. Kusunoki, M. Mukaida, H. Yamasaki, Y. Nakagawa

研究成果: ジャーナルへの寄稿学術誌査読

30 被引用数 (Scopus)

抄録

We have examined the correlation between the critical current density (Jc) and the surface resistance (R(s)) of an YBa2Cu3O7-δ (YBCO) thin film. YBCO films were prepared in an inductively coupled plasma sputtering system on MgO and BSO/MgO substrates. BaSnO3 (BSO) was used as a buffer material for the MgO substrates. Jc was determined by magnetic measurements, and Rs was measured using a sapphire rod resonator method. The correlation of critical current and surface resistance has been reported previously, however, there is few researches in which a systematic correlation of Rs and Jc using the same sample has been done. To begin with, we measured Rs by the dielectric resonator method, and next, Jc was measured using the magnetic field method. As a result, it was proven that there was a strong correlation between Rs and Jc. We found that the relationship between Jc and Rs (at 22 GHz) could be expressed by the following equation, Rs = 2.0 × 107Jc-1, where the unit of R(s) is the ohm, and the unit of Jc is A/m2. It was found that the relation was applicable in a wide temperature range under Tc. The value of the surface resistance can be estimated, if an accurate critical current is obtained.

本文言語英語
ページ(範囲)671-674
ページ数4
ジャーナルPhysica C: Superconductivity and its applications
372-376
PART 2
DOI
出版ステータス出版済み - 8月 2002
外部発表はい

!!!All Science Journal Classification (ASJC) codes

  • 電子材料、光学材料、および磁性材料
  • 凝縮系物理学
  • エネルギー工学および電力技術
  • 電子工学および電気工学

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