The origin of gate bias stress instability and hysteresis in monolayer WS2 transistors
Changyong Lan, Xiaolin Kang, You Meng, Renjie Wei, Xiuming Bu, Sen Po Yip, Johnny C. Ho
研究成果: ジャーナルへの寄稿 › 学術誌 › 査読
8
被引用数
(Scopus)