Thermoelectric Voltage at Point Contacts by Electron Tunneling Effect

Kunio Hijikata, Kohei Ito, Osamu Nakabeppu, Patric E. Phelan, Kunikazu Torikoshi

研究成果: ジャーナルへの寄稿学術誌査読

抄録

When a temperature drop exists across a point contact which is formed by pressing a metal whisker against a metal plate, the thermoelectric voltage can be measured, even though the entire electric circuit is made from the same metal. This phenomenon is a result of the characteristic thermoelectric power (TEP), which depends on the electron tunneling effect through a severalangstroms-thick oxide layer at the point contact. In this study, the experimental values and theoretical values of the TEP are compared. There is a possibility of producing a new type of thermal probe using this point contact apparatus.

本文言語英語
ページ(範囲)2171-2175
ページ数5
ジャーナルTransactions of the Japan Society of Mechanical Engineers Series B
60
574
DOI
出版ステータス出版済み - 1994
外部発表はい

!!!All Science Journal Classification (ASJC) codes

  • 凝縮系物理学
  • 機械工学

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