Thickness dependence of interlayer fringe-field coupling in submicrometer NiFe/Cu multilayered pillars

M. Zhang, Y. Nozaki, Kimihide Matsuyama

研究成果: Contribution to journalArticle査読

2 被引用数 (Scopus)

抄録

The effect of fringe-field coupling on the magnetization reversal process in submicrometer scale giant magnetoresistive pillars consisting of [NiFe/Cu]6 has been investigated by means of current perpendicular to plane magnetoresistance measurements and numerical simulations. The parabolic and reversible magnetoresistance curves due to an opposite rotation of magnetization in neighboring NiFe layers were observed. To explain the field sensitivity of the pillars quantitatively, we have proposed a modified single-domain model, where the magnetic energy of the system is reconstructed using the result of the micromagnetic simulation of a magnetostatically coupled bilayer system. The calculated magnetoresistance curves are consistent with the experimental ones. From the calculated results, the amplitude of the saturation field is found to be proportional to the thickness of the ferromagnetic layer and inversely proportional to the square root of the nonmagnetic layer thickness.

本文言語英語
ページ(範囲)2583-2585
ページ数3
ジャーナルIEEE Transactions on Magnetics
41
10
DOI
出版ステータス出版済み - 10 1 2005

All Science Journal Classification (ASJC) codes

  • 電子材料、光学材料、および磁性材料
  • 電子工学および電気工学

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