Thickness dependence of proton conductivity of amorphous aluminosilicate nanofilm

Yoshitaka Aoki, H. Habazaki, Toyoki Kunitake

研究成果: Contribution to journalArticle査読

8 被引用数 (Scopus)

抄録

AlxSi1-x On films exhibit a drastic change of proton conductivity across the film by reducing their thickness to less than 100 nm. The temperature and humidity dependence of conductivity of the sub- 100 nm films is quite different from those of the thicker films. Furthermore, in the former thickness range, the value of conductivity markedly increases with reducing the film thickness, and its thickness dependence follows a power law with a fixed index of -2.1. This size-scaling effect can be explained by the percolation conductivity model that the probability for percolating of the conductive moiety in AlxSi1-x On films increases with decreasing the thickness.

本文言語英語
ページ(範囲)P13-P16
ジャーナルElectrochemical and Solid-State Letters
11
11
DOI
出版ステータス出版済み - 2008
外部発表はい

All Science Journal Classification (ASJC) codes

  • 化学工学(全般)
  • 材料科学(全般)
  • 物理化学および理論化学
  • 電気化学
  • 電子工学および電気工学

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