Microtomography combined with hard x-ray imaging microscopy has been employed to observe nanoscopic features in a material, which has, to date, only been done by the transmission electron microscopy (TEM). Here, the authors show a characteristic microstructure in an aluminum alloy, such as a slant gap between growing precipitates that impinge on each other due to the presence of a solute-depleted zone. Such observation is not possible by conventional projection microtomography even using the highest resolution available. It would appear that the present technique has a unique potential to observe nanoscopic features inside materials that are several orders of magnitude thicker than TEM specimens.
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