Three-dimensional strain mapping using in situ X-ray synchrotron microtomography

H. Toda, E. Maire, Y. Aoki, M. Kobayashi

研究成果: Contribution to journalReview article査読

28 被引用数 (Scopus)

抄録

Recent advances in X-ray microtomography have created the opportunity to image the interior of materials. Microstructural images that are similar to or about an order of magnitude higher in resolution than those currently obtained with light microscopy can now be obtained in three-dimensions using synchrotron radiation. Local strain mapping is readily enabled by processing these high-resolution tomographic images using either the microstructural tracking technique or the digital volume correlation technique. This article is a review of the methodology behind these techniques and discusses recent experimental research on three-dimensional (3D) strain mapping. Potential future research directions are also outlined.

本文言語英語
ページ(範囲)549-561
ページ数13
ジャーナルJournal of Strain Analysis for Engineering Design
46
7
DOI
出版ステータス出版済み - 10 2011
外部発表はい

All Science Journal Classification (ASJC) codes

  • モデリングとシミュレーション
  • 材料力学
  • 機械工学
  • 応用数学

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