Three-dimensional visualization of ductile fracture in an Al-Si alloy by high-resolution synchrotron X-ray microtomography

L. Qian, H. Toda, K. Uesugi, T. Ohgaki, M. Kobayashi, T. Kobayashi

研究成果: ジャーナルへの寄稿記事

20 引用 (Scopus)

抄録

A direct three-dimensional visualization of the ductile fracture process under monotonic loading, in an Al-Si-Mg alloy specimen containing a fatigue pre-crack, has been conducted by means of the high-resolution X-ray computed tomography. Different morphology features of the crack viewed on different cross sections within the bulk of the specimen are detected. The isolated voids are distinguished from the microcracks. The evolution of the crack and voids as a function of the applied load are monitored and analyzed three-dimensionally. The advantages of the technique over traditional cross sectional observations are demonstrated, which facilitates to understand the fracture mechanisms in ductile materials, and to elucidate the fracture/microstructure interaction in non-uniform mediums.

元の言語英語
ページ(範囲)293-296
ページ数4
ジャーナルMaterials Science and Engineering A
483-484
発行部数1-2 C
DOI
出版物ステータス出版済み - 6 15 2008
外部発表Yes

Fingerprint

Ductile fracture
Synchrotrons
synchrotrons
Visualization
cracks
Cracks
X rays
voids
high resolution
x rays
microcracks
Microcracks
Tomography
tomography
Fatigue of materials
microstructure
Microstructure
cross sections
interactions

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

これを引用

Three-dimensional visualization of ductile fracture in an Al-Si alloy by high-resolution synchrotron X-ray microtomography. / Qian, L.; Toda, H.; Uesugi, K.; Ohgaki, T.; Kobayashi, M.; Kobayashi, T.

:: Materials Science and Engineering A, 巻 483-484, 番号 1-2 C, 15.06.2008, p. 293-296.

研究成果: ジャーナルへの寄稿記事

Qian, L. ; Toda, H. ; Uesugi, K. ; Ohgaki, T. ; Kobayashi, M. ; Kobayashi, T. / Three-dimensional visualization of ductile fracture in an Al-Si alloy by high-resolution synchrotron X-ray microtomography. :: Materials Science and Engineering A. 2008 ; 巻 483-484, 番号 1-2 C. pp. 293-296.
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